<?xml version="1.0"?>
<oembed><version>1.0</version><provider_name>Engineer News Network</provider_name><provider_url>https://www.engineernewsnetwork.com/blog</provider_url><title>Powering semiconductor automatic optical inspection &#xA0; - Engineer News Network</title><type>rich</type><width>600</width><height>338</height><html>&lt;blockquote class="wp-embedded-content" data-secret="3nwIZO0jXh"&gt;&lt;a href="https://www.engineernewsnetwork.com/blog/powering-semiconductor-automatic-optical-inspection/"&gt;Powering semiconductor automatic optical inspection &#xA0;&lt;/a&gt;&lt;/blockquote&gt;&lt;iframe sandbox="allow-scripts" security="restricted" src="https://www.engineernewsnetwork.com/blog/powering-semiconductor-automatic-optical-inspection/embed/#?secret=3nwIZO0jXh" width="600" height="338" title="&#x201C;Powering semiconductor automatic optical inspection &#xA0;&#x201D; &#x2014; Engineer News Network" data-secret="3nwIZO0jXh" frameborder="0" marginwidth="0" marginheight="0" scrolling="no" class="wp-embedded-content"&gt;&lt;/iframe&gt;&lt;script type="text/javascript"&gt;
/* &lt;![CDATA[ */
/*! This file is auto-generated */
!function(d,l){"use strict";l.querySelector&amp;&amp;d.addEventListener&amp;&amp;"undefined"!=typeof URL&amp;&amp;(d.wp=d.wp||{},d.wp.receiveEmbedMessage||(d.wp.receiveEmbedMessage=function(e){var t=e.data;if((t||t.secret||t.message||t.value)&amp;&amp;!/[^a-zA-Z0-9]/.test(t.secret)){for(var s,r,n,a=l.querySelectorAll('iframe[data-secret="'+t.secret+'"]'),o=l.querySelectorAll('blockquote[data-secret="'+t.secret+'"]'),c=new RegExp("^https?:$","i"),i=0;i&lt;o.length;i++)o[i].style.display="none";for(i=0;i&lt;a.length;i++)s=a[i],e.source===s.contentWindow&amp;&amp;(s.removeAttribute("style"),"height"===t.message?(1e3&lt;(r=parseInt(t.value,10))?r=1e3:~~r&lt;200&amp;&amp;(r=200),s.height=r):"link"===t.message&amp;&amp;(r=new URL(s.getAttribute("src")),n=new URL(t.value),c.test(n.protocol))&amp;&amp;n.host===r.host&amp;&amp;l.activeElement===s&amp;&amp;(d.top.location.href=t.value))}},d.addEventListener("message",d.wp.receiveEmbedMessage,!1),l.addEventListener("DOMContentLoaded",function(){for(var e,t,s=l.querySelectorAll("iframe.wp-embedded-content"),r=0;r&lt;s.length;r++)(t=(e=s[r]).getAttribute("data-secret"))||(t=Math.random().toString(36).substring(2,12),e.src+="#?secret="+t,e.setAttribute("data-secret",t)),e.contentWindow.postMessage({message:"ready",secret:t},"*")},!1)))}(window,document);
//# sourceURL=https://www.engineernewsnetwork.com/blog/wp-includes/js/wp-embed.min.js
/* ]]&gt; */
&lt;/script&gt;
</html><thumbnail_url>https://www.engineernewsnetwork.com/blog/wp-content/uploads/2023/01/63194_PR_DDR5-RDIMM.jpg</thumbnail_url><thumbnail_width>983</thumbnail_width><thumbnail_height>555</thumbnail_height><description>With the recent launch of Innodisk AI, which provides a AI solution for industrial integrators, DDR5 series DRAM plays a key role for a variety of applications, including Automated Optical Inspection solutions. With the rise in demand for semiconductors, and the trend towards smaller and smaller processes, the need for automatic systems to detect semiconductor &hellip;</description></oembed>
