{"id":12115,"date":"2019-05-10T11:00:35","date_gmt":"2019-05-10T10:00:35","guid":{"rendered":"https:\/\/www.engineernewsnetwork.com\/blog\/?p=12115"},"modified":"2019-05-09T11:46:44","modified_gmt":"2019-05-09T10:46:44","slug":"substrate-coupling-analysis-solution-to-address-unwanted-parasitic-effects","status":"publish","type":"post","link":"https:\/\/www.engineernewsnetwork.com\/blog\/substrate-coupling-analysis-solution-to-address-unwanted-parasitic-effects\/","title":{"rendered":"Substrate coupling analysis solution to address unwanted parasitic effects"},"content":{"rendered":"\n<p><strong><a href=\"http:\/\/(http:\/\/www.xfab.com\" target=\"_blank\" rel=\"noreferrer noopener\" aria-label=\"X-FAB Silicon Foundries SE (opens in a new tab)\">X-FAB Silicon Foundries SE<\/a><\/strong> has announced the introduction of SubstrateXtractor.<\/p>\n\n\n\n<p>Unwanted substrate couplings can impact modern IC developments, causing parasitic effects that are damaging to overall performance.&nbsp;<\/p>\n\n\n\n<p>Engineers have to deal with this by taking a slow and laborious \u2018trial and error\u2019 approach, which calls for the allocation of many hours of experienced engineers\u2019 time while numerous different design iterations are made and then experimented with.&nbsp; &nbsp;<\/p>\n\n\n\n<p>The objective of SubstrateXtractor is to change all that.&nbsp;<\/p>\n\n\n\n<p>Created in partnership with Swiss EDA software vendor PN Solutions, and based on its innovative PNAware product, this is the semiconductor industry\u2019s first commercially available tool dedicated to addressing the simulation of large signal substrate parasitic effects.&nbsp;<\/p>\n\n\n\n<p>Working in conjunction with X-FAB\u2019s established simulation libraries, it allows engineers to investigate where potential substrate coupling issues could occur and make the changes necessary to eliminate them (via better floorplanning, guard rings, etc) before the initial tape-out has even begun.&nbsp;<\/p>\n\n\n\n<p>Through it, engineers will gain full visibility of all the active and passive elements within the substrate and be able to experiment with different simulations in order to find a design concept that delivers maximum substrate coupling immunity within the project\u2019s particular parametric constraints.&nbsp;<\/p>\n\n\n\n<p>Furthermore, they are able to determine the minimum number of substrate contacts and guard rings needed for a project, no matter how complex and sophisticated it is \u2013 thereby resulting in more effective utilization of the available area. \u00a0 <\/p>\n\n\n\n<p>\u201cBy employing the SubstrateXtractor tool, layout engineers will be able to uncover any adverse substrate effects early on in the development cycle and subsequently mitigate them,\u201d explains Joerg Doblaski, Director of Design Support at X-FAB. \u201cThis will make IC implementation procedures far more streamlined and quicker to complete, avoiding the need to rework designs to increase levels of optimisation, and resulting in significant cost savings.\u201d\u00a0 \u00a0<\/p>\n\n\n\n<p>SubstrateXtractor is set to dramatically reduce the number of design iterations required &#8211; leading to much lower engineering overheads. This results in a faster time to market making a first-time-right analog design possible.&nbsp;<\/p>\n\n\n\n<p>From now onwards this functionality will be integrated into X-FAB\u2019s process design kit (PDK) and available for use with the company\u2019s XH018 high voltage 0.18\u00b5m mixed-signal CMOS offering. <\/p>\n\n\n\n<p>A version for the power management process XP018 will soon follow.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>X-FAB Silicon Foundries SE has announced the introduction of SubstrateXtractor. Unwanted substrate couplings can impact modern IC developments, causing parasitic effects that are damaging to overall performance.&nbsp; Engineers have to deal with this by taking a slow and laborious \u2018trial and error\u2019 approach, which calls for the allocation of many hours of experienced engineers\u2019 time &hellip;<\/p>\n","protected":false},"author":1,"featured_media":12116,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[105],"tags":[6200,1346],"class_list":["post-12115","post","type-post","status-publish","format-standard","has-post-thumbnail","","category-design","tag-substratextractor","tag-x-fab"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.4 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Substrate coupling analysis solution to address unwanted parasitic effects - Engineer News Network<\/title>\n<meta name=\"description\" content=\"Powerful new tool facilitates first-time-right analogue and high voltage design implementation in even the most challenging of scenarios\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.engineernewsnetwork.com\/blog\/substrate-coupling-analysis-solution-to-address-unwanted-parasitic-effects\/\" \/>\n<meta property=\"og:locale\" content=\"en_GB\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Substrate coupling analysis solution to address unwanted parasitic effects - Engineer News Network\" \/>\n<meta property=\"og:description\" content=\"Powerful new tool facilitates first-time-right analogue and high voltage design implementation in even the most challenging of scenarios\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.engineernewsnetwork.com\/blog\/substrate-coupling-analysis-solution-to-address-unwanted-parasitic-effects\/\" \/>\n<meta property=\"og:site_name\" content=\"Engineer News Network\" \/>\n<meta property=\"article:published_time\" content=\"2019-05-10T10:00:35+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2019\/05\/Image_PR_SubstrateXtractor_May2019.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"1200\" \/>\n\t<meta property=\"og:image:height\" content=\"1029\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"author\" content=\"admin\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"admin\" \/>\n\t<meta name=\"twitter:label2\" content=\"Estimated reading time\" \/>\n\t<meta name=\"twitter:data2\" content=\"2 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/substrate-coupling-analysis-solution-to-address-unwanted-parasitic-effects\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/substrate-coupling-analysis-solution-to-address-unwanted-parasitic-effects\\\/\"},\"author\":{\"name\":\"admin\",\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/#\\\/schema\\\/person\\\/4477342aea8e299c6a21761e513ea8e1\"},\"headline\":\"Substrate coupling analysis solution to address unwanted parasitic effects\",\"datePublished\":\"2019-05-10T10:00:35+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/substrate-coupling-analysis-solution-to-address-unwanted-parasitic-effects\\\/\"},\"wordCount\":393,\"image\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/substrate-coupling-analysis-solution-to-address-unwanted-parasitic-effects\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/wp-content\\\/uploads\\\/2019\\\/05\\\/Image_PR_SubstrateXtractor_May2019.jpg\",\"keywords\":[\"SubstrateXtractor\",\"X-FAB\"],\"articleSection\":[\"Design\"],\"inLanguage\":\"en-GB\"},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/substrate-coupling-analysis-solution-to-address-unwanted-parasitic-effects\\\/\",\"url\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/substrate-coupling-analysis-solution-to-address-unwanted-parasitic-effects\\\/\",\"name\":\"Substrate coupling analysis solution to address unwanted parasitic effects - Engineer News Network\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/substrate-coupling-analysis-solution-to-address-unwanted-parasitic-effects\\\/#primaryimage\"},\"image\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/substrate-coupling-analysis-solution-to-address-unwanted-parasitic-effects\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/wp-content\\\/uploads\\\/2019\\\/05\\\/Image_PR_SubstrateXtractor_May2019.jpg\",\"datePublished\":\"2019-05-10T10:00:35+00:00\",\"author\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/#\\\/schema\\\/person\\\/4477342aea8e299c6a21761e513ea8e1\"},\"description\":\"Powerful new tool facilitates first-time-right analogue and high voltage design implementation in even the most challenging of scenarios\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/substrate-coupling-analysis-solution-to-address-unwanted-parasitic-effects\\\/#breadcrumb\"},\"inLanguage\":\"en-GB\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/substrate-coupling-analysis-solution-to-address-unwanted-parasitic-effects\\\/\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"en-GB\",\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/substrate-coupling-analysis-solution-to-address-unwanted-parasitic-effects\\\/#primaryimage\",\"url\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/wp-content\\\/uploads\\\/2019\\\/05\\\/Image_PR_SubstrateXtractor_May2019.jpg\",\"contentUrl\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/wp-content\\\/uploads\\\/2019\\\/05\\\/Image_PR_SubstrateXtractor_May2019.jpg\",\"width\":1200,\"height\":1029,\"caption\":\"Powerful new tool facilitates first-time-right analogue and high voltage design implementation in even the most challenging of scenarios\"},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/substrate-coupling-analysis-solution-to-address-unwanted-parasitic-effects\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Substrate coupling analysis solution to address unwanted parasitic effects\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/#website\",\"url\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/\",\"name\":\"Engineer News Network\",\"description\":\"The ultimate online news and information resource for today's engineer\",\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-GB\"},{\"@type\":\"Person\",\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/#\\\/schema\\\/person\\\/4477342aea8e299c6a21761e513ea8e1\",\"name\":\"admin\",\"url\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/author\\\/admin\\\/\"}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"Substrate coupling analysis solution to address unwanted parasitic effects - Engineer News Network","description":"Powerful new tool facilitates first-time-right analogue and high voltage design implementation in even the most challenging of scenarios","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.engineernewsnetwork.com\/blog\/substrate-coupling-analysis-solution-to-address-unwanted-parasitic-effects\/","og_locale":"en_GB","og_type":"article","og_title":"Substrate coupling analysis solution to address unwanted parasitic effects - Engineer News Network","og_description":"Powerful new tool facilitates first-time-right analogue and high voltage design implementation in even the most challenging of scenarios","og_url":"https:\/\/www.engineernewsnetwork.com\/blog\/substrate-coupling-analysis-solution-to-address-unwanted-parasitic-effects\/","og_site_name":"Engineer News Network","article_published_time":"2019-05-10T10:00:35+00:00","og_image":[{"width":1200,"height":1029,"url":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2019\/05\/Image_PR_SubstrateXtractor_May2019.jpg","type":"image\/jpeg"}],"author":"admin","twitter_card":"summary_large_image","twitter_misc":{"Written by":"admin","Estimated reading time":"2 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/substrate-coupling-analysis-solution-to-address-unwanted-parasitic-effects\/#article","isPartOf":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/substrate-coupling-analysis-solution-to-address-unwanted-parasitic-effects\/"},"author":{"name":"admin","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/#\/schema\/person\/4477342aea8e299c6a21761e513ea8e1"},"headline":"Substrate coupling analysis solution to address unwanted parasitic effects","datePublished":"2019-05-10T10:00:35+00:00","mainEntityOfPage":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/substrate-coupling-analysis-solution-to-address-unwanted-parasitic-effects\/"},"wordCount":393,"image":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/substrate-coupling-analysis-solution-to-address-unwanted-parasitic-effects\/#primaryimage"},"thumbnailUrl":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2019\/05\/Image_PR_SubstrateXtractor_May2019.jpg","keywords":["SubstrateXtractor","X-FAB"],"articleSection":["Design"],"inLanguage":"en-GB"},{"@type":"WebPage","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/substrate-coupling-analysis-solution-to-address-unwanted-parasitic-effects\/","url":"https:\/\/www.engineernewsnetwork.com\/blog\/substrate-coupling-analysis-solution-to-address-unwanted-parasitic-effects\/","name":"Substrate coupling analysis solution to address unwanted parasitic effects - Engineer News Network","isPartOf":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/#website"},"primaryImageOfPage":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/substrate-coupling-analysis-solution-to-address-unwanted-parasitic-effects\/#primaryimage"},"image":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/substrate-coupling-analysis-solution-to-address-unwanted-parasitic-effects\/#primaryimage"},"thumbnailUrl":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2019\/05\/Image_PR_SubstrateXtractor_May2019.jpg","datePublished":"2019-05-10T10:00:35+00:00","author":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/#\/schema\/person\/4477342aea8e299c6a21761e513ea8e1"},"description":"Powerful new tool facilitates first-time-right analogue and high voltage design implementation in even the most challenging of scenarios","breadcrumb":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/substrate-coupling-analysis-solution-to-address-unwanted-parasitic-effects\/#breadcrumb"},"inLanguage":"en-GB","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.engineernewsnetwork.com\/blog\/substrate-coupling-analysis-solution-to-address-unwanted-parasitic-effects\/"]}]},{"@type":"ImageObject","inLanguage":"en-GB","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/substrate-coupling-analysis-solution-to-address-unwanted-parasitic-effects\/#primaryimage","url":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2019\/05\/Image_PR_SubstrateXtractor_May2019.jpg","contentUrl":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2019\/05\/Image_PR_SubstrateXtractor_May2019.jpg","width":1200,"height":1029,"caption":"Powerful new tool facilitates first-time-right analogue and high voltage design implementation in even the most challenging of scenarios"},{"@type":"BreadcrumbList","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/substrate-coupling-analysis-solution-to-address-unwanted-parasitic-effects\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/www.engineernewsnetwork.com\/blog\/"},{"@type":"ListItem","position":2,"name":"Substrate coupling analysis solution to address unwanted parasitic effects"}]},{"@type":"WebSite","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/#website","url":"https:\/\/www.engineernewsnetwork.com\/blog\/","name":"Engineer News Network","description":"The ultimate online news and information resource for today's engineer","potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.engineernewsnetwork.com\/blog\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-GB"},{"@type":"Person","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/#\/schema\/person\/4477342aea8e299c6a21761e513ea8e1","name":"admin","url":"https:\/\/www.engineernewsnetwork.com\/blog\/author\/admin\/"}]}},"_links":{"self":[{"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/posts\/12115","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/comments?post=12115"}],"version-history":[{"count":1,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/posts\/12115\/revisions"}],"predecessor-version":[{"id":12117,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/posts\/12115\/revisions\/12117"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/media\/12116"}],"wp:attachment":[{"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/media?parent=12115"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/categories?post=12115"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/tags?post=12115"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}