{"id":16455,"date":"2020-05-01T10:00:00","date_gmt":"2020-05-01T09:00:00","guid":{"rendered":"https:\/\/www.engineernewsnetwork.com\/blog\/?p=16455"},"modified":"2020-05-01T12:01:37","modified_gmt":"2020-05-01T11:01:37","slug":"phase-noise-analyser-for-precision-oscillator-characterisation","status":"publish","type":"post","link":"https:\/\/www.engineernewsnetwork.com\/blog\/phase-noise-analyser-for-precision-oscillator-characterisation\/","title":{"rendered":"Phase Noise Analyser for precision oscillator characterisation"},"content":{"rendered":"\n

The 53100A Phase Noise Analyzer<\/a><\/strong> is designed for engineers and scientists who rely on precise and accurate measurement of frequency signals generated for 5G networks, data centres, commercial and military aircraft systems, space vehicles, communication satellites and metrology applications.\u00a0<\/p>\n\n\n\n

Capable of measuring radio frequency (RF) signals up to 200 MHz, the new test instrument rapidly acquires frequency signals and characterises the phase noise, jitter, Allan deviation (ADEV) and time deviation (TDEV) quickly and precisely. <\/p>\n\n\n\n

All attributes of a frequency reference can be completely characterised with a single instrument within minutes.<\/p>\n\n\n\n

The 53100A Phase Noise Analyzer enables a variety of configurations by allowing up to three separate devices to be tested simultaneously using a single reference, enabling higher capacity for stability measurements. <\/p>\n\n\n\n

At 344 x 215 x 91mm (13.5 x 8.5 x 3.6 inches), the phase noise test instrument is small enough for integration into manufacturing Automated Test Equipment (ATE) systems, yet powerful enough for laboratory-grade metrology. Its interface provides backward compatibility with Microchip\u2019s 51xxA test sets\u2019 command and data stream, reducing the need to redesign existing ATE infrastructure. <\/p>\n\n\n\n

The 53100A Phase Noise Analyzer provides flexibility by allowing an input reference device to be connected through the front panel at a different nominal frequency than the device under test \u2013 allowing a single reference to characterize a variety of oscillator products. <\/p>\n\n\n\n

Rubidium frequency standards such as Microchip\u2019s 8040C-LN or a quartz oscillator such as Microchip\u2019s 1000C Ovenized Crystal Oscillator (OCXO) could be used as a reference as well as other manufacturers\u2019 precise oscillators. <\/p>\n\n\n\n

The 53100A Phase Noise Analyzer is available now. Microchip supports the 53100A Phase Noise Analyzer with technical support services as well as an extended warranty. <\/p>\n","protected":false},"excerpt":{"rendered":"

The 53100A Phase Noise Analyzer is designed for engineers and scientists who rely on precise and accurate measurement of frequency signals generated for 5G networks, data centres, commercial and military aircraft systems, space vehicles, communication satellites and metrology applications.\u00a0 Capable of measuring radio frequency (RF) signals up to 200 MHz, the new test instrument rapidly …<\/p>\n","protected":false},"author":1,"featured_media":16460,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[104],"tags":[8178,169],"class_list":["post-16455","post","type-post","status-publish","format-standard","has-post-thumbnail","","category-electronics","tag-53100a-phase-noise-analyzer","tag-microchip"],"yoast_head":"\nPhase Noise Analyser for precision oscillator characterisation - Engineer News Network<\/title>\n<meta name=\"description\" content=\"Next-generation phase noise instrument combines timing technologies in a smaller, higher-performance measurement instrument\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.engineernewsnetwork.com\/blog\/phase-noise-analyser-for-precision-oscillator-characterisation\/\" \/>\n<meta property=\"og:locale\" content=\"en_GB\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Phase Noise Analyser for precision oscillator characterisation - 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Engineer News Network\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/phase-noise-analyser-for-precision-oscillator-characterisation\\\/#primaryimage\"},\"image\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/phase-noise-analyser-for-precision-oscillator-characterisation\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/wp-content\\\/uploads\\\/2020\\\/05\\\/MC1496-Microchip-53100A.jpg\",\"datePublished\":\"2020-05-01T09:00:00+00:00\",\"dateModified\":\"2020-05-01T11:01:37+00:00\",\"author\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/#\\\/schema\\\/person\\\/4477342aea8e299c6a21761e513ea8e1\"},\"description\":\"Next-generation phase noise instrument combines timing technologies in a smaller, higher-performance measurement instrument\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/phase-noise-analyser-for-precision-oscillator-characterisation\\\/#breadcrumb\"},\"inLanguage\":\"en-GB\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/phase-noise-analyser-for-precision-oscillator-characterisation\\\/\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"en-GB\",\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/phase-noise-analyser-for-precision-oscillator-characterisation\\\/#primaryimage\",\"url\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/wp-content\\\/uploads\\\/2020\\\/05\\\/MC1496-Microchip-53100A.jpg\",\"contentUrl\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/wp-content\\\/uploads\\\/2020\\\/05\\\/MC1496-Microchip-53100A.jpg\",\"width\":800,\"height\":624,\"caption\":\"Next-generation phase noise instrument combines timing technologies in a smaller, higher-performance measurement instrument\"},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/phase-noise-analyser-for-precision-oscillator-characterisation\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Phase Noise Analyser for precision oscillator characterisation\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/#website\",\"url\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/\",\"name\":\"Engineer News Network\",\"description\":\"The ultimate online news and information resource for today's engineer\",\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-GB\"},{\"@type\":\"Person\",\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/#\\\/schema\\\/person\\\/4477342aea8e299c6a21761e513ea8e1\",\"name\":\"admin\",\"url\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/author\\\/admin\\\/\"}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"Phase Noise Analyser for precision oscillator characterisation - Engineer News Network","description":"Next-generation phase noise instrument combines timing technologies in a smaller, higher-performance measurement instrument","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.engineernewsnetwork.com\/blog\/phase-noise-analyser-for-precision-oscillator-characterisation\/","og_locale":"en_GB","og_type":"article","og_title":"Phase Noise Analyser for precision oscillator characterisation - Engineer News Network","og_description":"Next-generation phase noise instrument combines timing technologies in a smaller, higher-performance measurement instrument","og_url":"https:\/\/www.engineernewsnetwork.com\/blog\/phase-noise-analyser-for-precision-oscillator-characterisation\/","og_site_name":"Engineer News Network","article_published_time":"2020-05-01T09:00:00+00:00","article_modified_time":"2020-05-01T11:01:37+00:00","og_image":[{"width":800,"height":624,"url":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2020\/05\/MC1496-Microchip-53100A.jpg","type":"image\/jpeg"}],"author":"admin","twitter_card":"summary_large_image","twitter_misc":{"Written by":"admin","Estimated reading time":"1 minute"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/phase-noise-analyser-for-precision-oscillator-characterisation\/#article","isPartOf":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/phase-noise-analyser-for-precision-oscillator-characterisation\/"},"author":{"name":"admin","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/#\/schema\/person\/4477342aea8e299c6a21761e513ea8e1"},"headline":"Phase Noise Analyser for precision oscillator characterisation","datePublished":"2020-05-01T09:00:00+00:00","dateModified":"2020-05-01T11:01:37+00:00","mainEntityOfPage":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/phase-noise-analyser-for-precision-oscillator-characterisation\/"},"wordCount":285,"image":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/phase-noise-analyser-for-precision-oscillator-characterisation\/#primaryimage"},"thumbnailUrl":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2020\/05\/MC1496-Microchip-53100A.jpg","keywords":["53100A Phase Noise Analyzer","Microchip"],"articleSection":["Electronics"],"inLanguage":"en-GB"},{"@type":"WebPage","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/phase-noise-analyser-for-precision-oscillator-characterisation\/","url":"https:\/\/www.engineernewsnetwork.com\/blog\/phase-noise-analyser-for-precision-oscillator-characterisation\/","name":"Phase Noise Analyser for precision oscillator characterisation - Engineer News Network","isPartOf":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/#website"},"primaryImageOfPage":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/phase-noise-analyser-for-precision-oscillator-characterisation\/#primaryimage"},"image":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/phase-noise-analyser-for-precision-oscillator-characterisation\/#primaryimage"},"thumbnailUrl":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2020\/05\/MC1496-Microchip-53100A.jpg","datePublished":"2020-05-01T09:00:00+00:00","dateModified":"2020-05-01T11:01:37+00:00","author":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/#\/schema\/person\/4477342aea8e299c6a21761e513ea8e1"},"description":"Next-generation phase noise instrument combines timing technologies in a smaller, higher-performance measurement instrument","breadcrumb":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/phase-noise-analyser-for-precision-oscillator-characterisation\/#breadcrumb"},"inLanguage":"en-GB","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.engineernewsnetwork.com\/blog\/phase-noise-analyser-for-precision-oscillator-characterisation\/"]}]},{"@type":"ImageObject","inLanguage":"en-GB","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/phase-noise-analyser-for-precision-oscillator-characterisation\/#primaryimage","url":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2020\/05\/MC1496-Microchip-53100A.jpg","contentUrl":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2020\/05\/MC1496-Microchip-53100A.jpg","width":800,"height":624,"caption":"Next-generation phase noise instrument combines timing technologies in a smaller, higher-performance measurement instrument"},{"@type":"BreadcrumbList","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/phase-noise-analyser-for-precision-oscillator-characterisation\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/www.engineernewsnetwork.com\/blog\/"},{"@type":"ListItem","position":2,"name":"Phase Noise Analyser for precision oscillator characterisation"}]},{"@type":"WebSite","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/#website","url":"https:\/\/www.engineernewsnetwork.com\/blog\/","name":"Engineer News Network","description":"The ultimate online news and information resource for today's engineer","potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.engineernewsnetwork.com\/blog\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-GB"},{"@type":"Person","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/#\/schema\/person\/4477342aea8e299c6a21761e513ea8e1","name":"admin","url":"https:\/\/www.engineernewsnetwork.com\/blog\/author\/admin\/"}]}},"_links":{"self":[{"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/posts\/16455","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/comments?post=16455"}],"version-history":[{"count":3,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/posts\/16455\/revisions"}],"predecessor-version":[{"id":16500,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/posts\/16455\/revisions\/16500"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/media\/16460"}],"wp:attachment":[{"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/media?parent=16455"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/categories?post=16455"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/tags?post=16455"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}