{"id":16870,"date":"2020-06-05T09:45:00","date_gmt":"2020-06-05T08:45:00","guid":{"rendered":"https:\/\/www.engineernewsnetwork.com\/blog\/?p=16870"},"modified":"2020-06-05T09:39:06","modified_gmt":"2020-06-05T08:39:06","slug":"materials-characterisation-software-for-microscopy-data-visualisation-and-analysis","status":"publish","type":"post","link":"https:\/\/www.engineernewsnetwork.com\/blog\/materials-characterisation-software-for-microscopy-data-visualisation-and-analysis\/","title":{"rendered":"Materials characterisation: software for microscopy data visualisation and analysis"},"content":{"rendered":"\n

Oxford Instruments and Digital Surf<\/a><\/strong>, creator of the industry-standard Mountains surface and image analysis software platform, announce the release of Relate software for users of Oxford Instruments’ leading-edge tools for materials characterisation.<\/p>\n\n\n\n

This software will bring great value to Oxford Instruments’ users working in R&D across a wide range of academic and industrial applications including semiconductors, renewable energy, mining, metallurgy, and forensics.<\/p>\n\n\n\n

Relate software lets users get more out of their data by supplying accurate, innovative tools for visualising, analysing and reporting, in particular:<\/p>\n\n\n\n

Correlation of spectrometry (EDS and EBSD) data with atomic force microscopy data and microscopy images with easy-to-use tools for rapid manual and semi-automated correlation of multiple images.<\/p>\n\n\n\n

3D and 2D visualisation of composite data sets showing EDS, EBSD and EM image layers combined with topography and material properties as measured by AFM, helping to reveal the micro- and nano-characteristics of a sample.<\/p>\n\n\n\n

Analysis of correlated quantitative data by extracting underlying data values in addition to qualitative images (eg, x-ray counts for each element).<\/p>\n\n\n\n

Easy report generation: data and images can be organised and published in popular formats (PDF, Word, etc).<\/p>\n\n\n\n

Documented, interactive workflow allowing maximum flexibility and traceability during the image analysis process.<\/p>\n\n\n\n

“Relate software is a highly accurate tool for correlative analysis for researchers utilising several different instrument technologies (EM, AFM and spectrometry). Using one single software program to combine different datasets helps ensure the efficiency of analysis routines and the generation of meaningful results,” said Louise Hughes, Product manager for Life Sciences, NanoAnalysis. <\/p>\n","protected":false},"excerpt":{"rendered":"

Oxford Instruments and Digital Surf, creator of the industry-standard Mountains surface and image analysis software platform, announce the release of Relate software for users of Oxford Instruments’ leading-edge tools for materials characterisation. This software will bring great value to Oxford Instruments’ users working in R&D across a wide range of academic and industrial applications including …<\/p>\n","protected":false},"author":1,"featured_media":16871,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[105,104,1],"tags":[8354,8353,8352,8351,8355],"class_list":["post-16870","post","type-post","status-publish","format-standard","has-post-thumbnail","","category-design","category-electronics","category-process","tag-digital-surf","tag-materials-characterisation","tag-oxford-instruments","tag-qualitative-and-quantitative-data-correlation","tag-relate"],"yoast_head":"\nMaterials characterisation: software for microscopy data visualisation and analysis - Engineer News Network<\/title>\n<meta name=\"description\" content=\"For qualitative and quantitative data correlation between electron microscope spectrometry (EDS, EBSD and electron images) and atomic force microscopy\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.engineernewsnetwork.com\/blog\/materials-characterisation-software-for-microscopy-data-visualisation-and-analysis\/\" \/>\n<meta property=\"og:locale\" content=\"en_GB\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Materials characterisation: software for microscopy data visualisation and analysis - Engineer News Network\" \/>\n<meta property=\"og:description\" content=\"For qualitative and quantitative data correlation between electron microscope spectrometry (EDS, EBSD and electron images) and atomic force microscopy\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.engineernewsnetwork.com\/blog\/materials-characterisation-software-for-microscopy-data-visualisation-and-analysis\/\" \/>\n<meta property=\"og:site_name\" content=\"Engineer News Network\" \/>\n<meta property=\"article:published_time\" content=\"2020-06-05T08:45:00+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2020\/05\/relate-software-circuit-board-WEB-3.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"500\" \/>\n\t<meta property=\"og:image:height\" content=\"297\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"author\" content=\"admin\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"admin\" \/>\n\t<meta name=\"twitter:label2\" content=\"Estimated reading time\" \/>\n\t<meta name=\"twitter:data2\" content=\"1 minute\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/materials-characterisation-software-for-microscopy-data-visualisation-and-analysis\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/materials-characterisation-software-for-microscopy-data-visualisation-and-analysis\\\/\"},\"author\":{\"name\":\"admin\",\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/#\\\/schema\\\/person\\\/4477342aea8e299c6a21761e513ea8e1\"},\"headline\":\"Materials characterisation: software for microscopy data visualisation and analysis\",\"datePublished\":\"2020-06-05T08:45:00+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/materials-characterisation-software-for-microscopy-data-visualisation-and-analysis\\\/\"},\"wordCount\":261,\"image\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/materials-characterisation-software-for-microscopy-data-visualisation-and-analysis\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/wp-content\\\/uploads\\\/2020\\\/05\\\/relate-software-circuit-board-WEB-3.jpg\",\"keywords\":[\"Digital Surf\",\"materials characterisation\",\"Oxford Instruments\",\"qualitative and quantitative data correlation\",\"Relate\"],\"articleSection\":[\"Design\",\"Electronics\",\"Process\"],\"inLanguage\":\"en-GB\"},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/materials-characterisation-software-for-microscopy-data-visualisation-and-analysis\\\/\",\"url\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/materials-characterisation-software-for-microscopy-data-visualisation-and-analysis\\\/\",\"name\":\"Materials characterisation: software for microscopy data visualisation and analysis - Engineer News Network\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/materials-characterisation-software-for-microscopy-data-visualisation-and-analysis\\\/#primaryimage\"},\"image\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/materials-characterisation-software-for-microscopy-data-visualisation-and-analysis\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/wp-content\\\/uploads\\\/2020\\\/05\\\/relate-software-circuit-board-WEB-3.jpg\",\"datePublished\":\"2020-06-05T08:45:00+00:00\",\"author\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/#\\\/schema\\\/person\\\/4477342aea8e299c6a21761e513ea8e1\"},\"description\":\"For qualitative and quantitative data correlation between electron microscope spectrometry (EDS, EBSD and electron images) and atomic force microscopy\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/materials-characterisation-software-for-microscopy-data-visualisation-and-analysis\\\/#breadcrumb\"},\"inLanguage\":\"en-GB\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/materials-characterisation-software-for-microscopy-data-visualisation-and-analysis\\\/\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"en-GB\",\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/materials-characterisation-software-for-microscopy-data-visualisation-and-analysis\\\/#primaryimage\",\"url\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/wp-content\\\/uploads\\\/2020\\\/05\\\/relate-software-circuit-board-WEB-3.jpg\",\"contentUrl\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/wp-content\\\/uploads\\\/2020\\\/05\\\/relate-software-circuit-board-WEB-3.jpg\",\"width\":500,\"height\":297,\"caption\":\"Atomic force microscopy topography combined with aluminium (green), oxygen (red) and titanium (blue) EDS maps using Relate software\"},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/materials-characterisation-software-for-microscopy-data-visualisation-and-analysis\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Materials characterisation: software for microscopy data visualisation and analysis\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/#website\",\"url\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/\",\"name\":\"Engineer News Network\",\"description\":\"The ultimate online news and information resource for today's engineer\",\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-GB\"},{\"@type\":\"Person\",\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/#\\\/schema\\\/person\\\/4477342aea8e299c6a21761e513ea8e1\",\"name\":\"admin\",\"url\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/author\\\/admin\\\/\"}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"Materials characterisation: software for microscopy data visualisation and analysis - Engineer News Network","description":"For qualitative and quantitative data correlation between electron microscope spectrometry (EDS, EBSD and electron images) and atomic force microscopy","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.engineernewsnetwork.com\/blog\/materials-characterisation-software-for-microscopy-data-visualisation-and-analysis\/","og_locale":"en_GB","og_type":"article","og_title":"Materials characterisation: software for microscopy data visualisation and analysis - Engineer News Network","og_description":"For qualitative and quantitative data correlation between electron microscope spectrometry (EDS, EBSD and electron images) and atomic force microscopy","og_url":"https:\/\/www.engineernewsnetwork.com\/blog\/materials-characterisation-software-for-microscopy-data-visualisation-and-analysis\/","og_site_name":"Engineer News Network","article_published_time":"2020-06-05T08:45:00+00:00","og_image":[{"width":500,"height":297,"url":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2020\/05\/relate-software-circuit-board-WEB-3.jpg","type":"image\/jpeg"}],"author":"admin","twitter_card":"summary_large_image","twitter_misc":{"Written by":"admin","Estimated reading time":"1 minute"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/materials-characterisation-software-for-microscopy-data-visualisation-and-analysis\/#article","isPartOf":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/materials-characterisation-software-for-microscopy-data-visualisation-and-analysis\/"},"author":{"name":"admin","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/#\/schema\/person\/4477342aea8e299c6a21761e513ea8e1"},"headline":"Materials characterisation: software for microscopy data visualisation and analysis","datePublished":"2020-06-05T08:45:00+00:00","mainEntityOfPage":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/materials-characterisation-software-for-microscopy-data-visualisation-and-analysis\/"},"wordCount":261,"image":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/materials-characterisation-software-for-microscopy-data-visualisation-and-analysis\/#primaryimage"},"thumbnailUrl":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2020\/05\/relate-software-circuit-board-WEB-3.jpg","keywords":["Digital Surf","materials characterisation","Oxford Instruments","qualitative and quantitative data correlation","Relate"],"articleSection":["Design","Electronics","Process"],"inLanguage":"en-GB"},{"@type":"WebPage","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/materials-characterisation-software-for-microscopy-data-visualisation-and-analysis\/","url":"https:\/\/www.engineernewsnetwork.com\/blog\/materials-characterisation-software-for-microscopy-data-visualisation-and-analysis\/","name":"Materials characterisation: software for microscopy data visualisation and analysis - Engineer News Network","isPartOf":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/#website"},"primaryImageOfPage":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/materials-characterisation-software-for-microscopy-data-visualisation-and-analysis\/#primaryimage"},"image":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/materials-characterisation-software-for-microscopy-data-visualisation-and-analysis\/#primaryimage"},"thumbnailUrl":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2020\/05\/relate-software-circuit-board-WEB-3.jpg","datePublished":"2020-06-05T08:45:00+00:00","author":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/#\/schema\/person\/4477342aea8e299c6a21761e513ea8e1"},"description":"For qualitative and quantitative data correlation between electron microscope spectrometry (EDS, EBSD and electron images) and atomic force microscopy","breadcrumb":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/materials-characterisation-software-for-microscopy-data-visualisation-and-analysis\/#breadcrumb"},"inLanguage":"en-GB","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.engineernewsnetwork.com\/blog\/materials-characterisation-software-for-microscopy-data-visualisation-and-analysis\/"]}]},{"@type":"ImageObject","inLanguage":"en-GB","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/materials-characterisation-software-for-microscopy-data-visualisation-and-analysis\/#primaryimage","url":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2020\/05\/relate-software-circuit-board-WEB-3.jpg","contentUrl":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2020\/05\/relate-software-circuit-board-WEB-3.jpg","width":500,"height":297,"caption":"Atomic force microscopy topography combined with aluminium (green), oxygen (red) and titanium (blue) EDS maps using Relate software"},{"@type":"BreadcrumbList","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/materials-characterisation-software-for-microscopy-data-visualisation-and-analysis\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/www.engineernewsnetwork.com\/blog\/"},{"@type":"ListItem","position":2,"name":"Materials characterisation: software for microscopy data visualisation and analysis"}]},{"@type":"WebSite","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/#website","url":"https:\/\/www.engineernewsnetwork.com\/blog\/","name":"Engineer News Network","description":"The ultimate online news and information resource for today's engineer","potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.engineernewsnetwork.com\/blog\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-GB"},{"@type":"Person","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/#\/schema\/person\/4477342aea8e299c6a21761e513ea8e1","name":"admin","url":"https:\/\/www.engineernewsnetwork.com\/blog\/author\/admin\/"}]}},"_links":{"self":[{"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/posts\/16870","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/comments?post=16870"}],"version-history":[{"count":2,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/posts\/16870\/revisions"}],"predecessor-version":[{"id":16969,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/posts\/16870\/revisions\/16969"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/media\/16871"}],"wp:attachment":[{"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/media?parent=16870"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/categories?post=16870"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/tags?post=16870"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}