{"id":21754,"date":"2022-05-17T10:02:53","date_gmt":"2022-05-17T09:02:53","guid":{"rendered":"https:\/\/www.engineernewsnetwork.com\/blog\/?p=21754"},"modified":"2022-05-17T10:02:53","modified_gmt":"2022-05-17T09:02:53","slug":"module-allows-easy-measurement-of-very-rough-films","status":"publish","type":"post","link":"https:\/\/www.engineernewsnetwork.com\/blog\/module-allows-easy-measurement-of-very-rough-films\/","title":{"rendered":"Module allows easy measurement of very rough films"},"content":{"rendered":"\n

Zygo Corporation<\/a><\/strong> has announced the release of version 9.0 of its Mx software platform for complete instrument control and data analysis. Ease-of-use is central to two key new capabilities in Mx 9.0: support for Zygo\u2019s Verifire Asphere+ (VFA+) instrument, and the addition of a \u2018robust films\u2019 module that allows easy measurement of very rough films.<\/p>\n\n\n\n

Version 9.0 builds on the strengths of Zygo\u2019s Mx software, including interactive 3D maps, quantitative phase data, intuitive navigation, & built-in SPC with statistics, control charting, and pass\/fail limits. The latest update allows users of the VFA+, Zygo\u2019s latest metrology platform designed to measure axisymmetric aspheres, to get from mounting a part to measurement and insight in just a few clicks. The user interface and software architecture have been redesigned from the customer\u2019s perspective, prioritizing ease of use and accessibility.  The focus was to dramatically simplify the user interface, making it more graphical, and more task- and flow-oriented.<\/p>\n\n\n\n

Martin Fay, Senior Scientist at Zygo says, \u201cThe key value proposition of our Mx software is to seamlessly integrate data acquisition and analysis. In real terms, this means that a customer can mount a part, hit measure, and easily get all the way to a final report and high-value results. The software does not just produce a map to be exported to a different software package for analysis. With Mx, customers can get beyond raw measurement data to an understanding of what it means.\u201d<\/p>\n\n\n\n

Mx 9.0 also provides a general toolkit for asphere analysis. Aspheres are made for numerous industry sectors and span a wide range of sizes and geometries, and customers can measure aspheres using a variety of ZYGO optical metrology instruments. The Mx asphere analysis toolkit can be used with any instrument, in alignment with the user\u2019s job steps \u2014\u00a0design, make, measure, and analyse.\u00a0<\/p>\n\n\n\n

Fay continues: \u201cMx 9.0 is the first release that supports the VFA+, an instrument designed specifically for the measurement of aspheres which traditional interferometers struggle to measure. The software has been designed from the perspective of the user\u2019s goals: design and produce a manufacturable asphere, then measure it to determine how much the produced asphere deviates from the design.\u201d<\/p>\n\n\n\n

Mx 9.0 improves the user experience for other applications as well, including measuring parts with transparent films. With this latest release, Zygo has advanced the state of the art in signal processing for optical profilers, enabling the characterisation of rough films on a rough substrate that has always proved challenging. These advances are now built into Mx 9.0, improving the robustness of coated surface metrology, and enabling characterisation of a whole new range of surfaces.<\/p>\n","protected":false},"excerpt":{"rendered":"

Zygo Corporation has announced the release of version 9.0 of its Mx software platform for complete instrument control and data analysis. Ease-of-use is central to two key new capabilities in Mx 9.0: support for Zygo\u2019s Verifire Asphere+ (VFA+) instrument, and the addition of a \u2018robust films\u2019 module that allows easy measurement of very rough films. …<\/p>\n","protected":false},"author":1,"featured_media":21755,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[105,104],"tags":[10243,1003,8248],"class_list":["post-21754","post","type-post","status-publish","format-standard","has-post-thumbnail","","category-design","category-electronics","tag-mx-9-0-software","tag-optical-metrology","tag-zygo"],"yoast_head":"\nModule allows easy measurement of very rough films - Engineer News Network<\/title>\n<meta name=\"description\" content=\"Zygo Corporation has announced the release of version 9.0 of its Mx software platform for complete instrument control and data analysis\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.engineernewsnetwork.com\/blog\/module-allows-easy-measurement-of-very-rough-films\/\" \/>\n<meta property=\"og:locale\" content=\"en_GB\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Module allows easy measurement of very rough films - 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Engineer News Network\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/module-allows-easy-measurement-of-very-rough-films\\\/#primaryimage\"},\"image\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/module-allows-easy-measurement-of-very-rough-films\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/wp-content\\\/uploads\\\/2022\\\/05\\\/MX-9-picture-1.jpg\",\"datePublished\":\"2022-05-17T09:02:53+00:00\",\"author\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/#\\\/schema\\\/person\\\/4477342aea8e299c6a21761e513ea8e1\"},\"description\":\"Zygo Corporation has announced the release of version 9.0 of its Mx software platform for complete instrument control and data analysis\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/module-allows-easy-measurement-of-very-rough-films\\\/#breadcrumb\"},\"inLanguage\":\"en-GB\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/module-allows-easy-measurement-of-very-rough-films\\\/\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"en-GB\",\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/module-allows-easy-measurement-of-very-rough-films\\\/#primaryimage\",\"url\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/wp-content\\\/uploads\\\/2022\\\/05\\\/MX-9-picture-1.jpg\",\"contentUrl\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/wp-content\\\/uploads\\\/2022\\\/05\\\/MX-9-picture-1.jpg\",\"width\":860,\"height\":469,\"caption\":\"Zygo releases Mx 9.0 software\"},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/module-allows-easy-measurement-of-very-rough-films\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Module allows easy measurement of very rough films\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/#website\",\"url\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/\",\"name\":\"Engineer News Network\",\"description\":\"The ultimate online news and information resource for today's engineer\",\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-GB\"},{\"@type\":\"Person\",\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/#\\\/schema\\\/person\\\/4477342aea8e299c6a21761e513ea8e1\",\"name\":\"admin\",\"url\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/author\\\/admin\\\/\"}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"Module allows easy measurement of very rough films - Engineer News Network","description":"Zygo Corporation has announced the release of version 9.0 of its Mx software platform for complete instrument control and data analysis","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.engineernewsnetwork.com\/blog\/module-allows-easy-measurement-of-very-rough-films\/","og_locale":"en_GB","og_type":"article","og_title":"Module allows easy measurement of very rough films - Engineer News Network","og_description":"Zygo Corporation has announced the release of version 9.0 of its Mx software platform for complete instrument control and data analysis","og_url":"https:\/\/www.engineernewsnetwork.com\/blog\/module-allows-easy-measurement-of-very-rough-films\/","og_site_name":"Engineer News Network","article_published_time":"2022-05-17T09:02:53+00:00","og_image":[{"width":860,"height":469,"url":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2022\/05\/MX-9-picture-1.jpg","type":"image\/jpeg"}],"author":"admin","twitter_card":"summary_large_image","twitter_misc":{"Written by":"admin","Estimated reading time":"2 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/module-allows-easy-measurement-of-very-rough-films\/#article","isPartOf":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/module-allows-easy-measurement-of-very-rough-films\/"},"author":{"name":"admin","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/#\/schema\/person\/4477342aea8e299c6a21761e513ea8e1"},"headline":"Module allows easy measurement of very rough films","datePublished":"2022-05-17T09:02:53+00:00","mainEntityOfPage":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/module-allows-easy-measurement-of-very-rough-films\/"},"wordCount":443,"image":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/module-allows-easy-measurement-of-very-rough-films\/#primaryimage"},"thumbnailUrl":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2022\/05\/MX-9-picture-1.jpg","keywords":["Mx 9.0 Software","optical metrology","ZYGO"],"articleSection":["Design","Electronics"],"inLanguage":"en-GB"},{"@type":"WebPage","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/module-allows-easy-measurement-of-very-rough-films\/","url":"https:\/\/www.engineernewsnetwork.com\/blog\/module-allows-easy-measurement-of-very-rough-films\/","name":"Module allows easy measurement of very rough films - Engineer News Network","isPartOf":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/#website"},"primaryImageOfPage":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/module-allows-easy-measurement-of-very-rough-films\/#primaryimage"},"image":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/module-allows-easy-measurement-of-very-rough-films\/#primaryimage"},"thumbnailUrl":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2022\/05\/MX-9-picture-1.jpg","datePublished":"2022-05-17T09:02:53+00:00","author":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/#\/schema\/person\/4477342aea8e299c6a21761e513ea8e1"},"description":"Zygo Corporation has announced the release of version 9.0 of its Mx software platform for complete instrument control and data analysis","breadcrumb":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/module-allows-easy-measurement-of-very-rough-films\/#breadcrumb"},"inLanguage":"en-GB","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.engineernewsnetwork.com\/blog\/module-allows-easy-measurement-of-very-rough-films\/"]}]},{"@type":"ImageObject","inLanguage":"en-GB","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/module-allows-easy-measurement-of-very-rough-films\/#primaryimage","url":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2022\/05\/MX-9-picture-1.jpg","contentUrl":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2022\/05\/MX-9-picture-1.jpg","width":860,"height":469,"caption":"Zygo releases Mx 9.0 software"},{"@type":"BreadcrumbList","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/module-allows-easy-measurement-of-very-rough-films\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/www.engineernewsnetwork.com\/blog\/"},{"@type":"ListItem","position":2,"name":"Module allows easy measurement of very rough films"}]},{"@type":"WebSite","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/#website","url":"https:\/\/www.engineernewsnetwork.com\/blog\/","name":"Engineer News Network","description":"The ultimate online news and information resource for today's engineer","potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.engineernewsnetwork.com\/blog\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-GB"},{"@type":"Person","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/#\/schema\/person\/4477342aea8e299c6a21761e513ea8e1","name":"admin","url":"https:\/\/www.engineernewsnetwork.com\/blog\/author\/admin\/"}]}},"_links":{"self":[{"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/posts\/21754","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/comments?post=21754"}],"version-history":[{"count":1,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/posts\/21754\/revisions"}],"predecessor-version":[{"id":21756,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/posts\/21754\/revisions\/21756"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/media\/21755"}],"wp:attachment":[{"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/media?parent=21754"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/categories?post=21754"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/tags?post=21754"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}