{"id":6582,"date":"2018-04-18T07:30:35","date_gmt":"2018-04-18T06:30:35","guid":{"rendered":"https:\/\/engineernewsnetwork.com\/blog\/?p=6582"},"modified":"2018-04-17T18:05:55","modified_gmt":"2018-04-17T17:05:55","slug":"improving-test-driven-software-development-methodology","status":"publish","type":"post","link":"https:\/\/www.engineernewsnetwork.com\/blog\/improving-test-driven-software-development-methodology\/","title":{"rendered":"Improving test-driven software development methodology"},"content":{"rendered":"<span class=\"highlight highlight-blue\"><a href=\"https:\/\/engineernewsnetwork.com\/blog\/microsemi-reaches-key-production-qualification-milestone-for-polarfire-fpga-family\/\" target=\"_blank\" rel=\"noopener\">Microsemi<\/a><\/span>\u00a0announces Antmicro, an international research and development company known for its work with emerging technologies in embedded and cyber-physical systems, has joined Microsemi&#8217;s Mi-V(TM) RISC-V ecosystem.<\/p>\n<figure id=\"attachment_6584\" aria-describedby=\"caption-attachment-6584\" style=\"width: 618px\" class=\"wp-caption alignnone\"><a href=\"https:\/\/engineernewsnetwork.com\/blog\/wp-content\/uploads\/2018\/04\/renode-ci.png\"><img loading=\"lazy\" decoding=\"async\" class=\"size-large wp-image-6584\" src=\"https:\/\/engineernewsnetwork.com\/blog\/wp-content\/uploads\/2018\/04\/renode-ci-1024x576.png\" alt=\"Improving test-driven software development methodology\" width=\"618\" height=\"348\" srcset=\"https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2018\/04\/renode-ci-1024x576.png 1024w, https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2018\/04\/renode-ci-300x169.png 300w, https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2018\/04\/renode-ci-768x432.png 768w, https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2018\/04\/renode-ci-800x450.png 800w, https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2018\/04\/renode-ci.png 1920w\" sizes=\"auto, (max-width: 618px) 100vw, 618px\" \/><\/a><figcaption id=\"caption-attachment-6584\" class=\"wp-caption-text\">Microsemi&#8217;s Mi-V Ecosystem continues to expand as new member Antmicro joins to develop Mi-V RISC-V processor subsystems for PolarFire FPGAs<\/figcaption><\/figure>\n<p>As the maker of the open source Renode framework for multi-node simulation, Antmicro has implemented support for <span class=\"highlight highlight-blue\"><a href=\"https:\/\/engineernewsnetwork.com\/blog\/microsemi-achieves-qml-class-q-qualification-for-its-rtg4-high-speed-radiation-tolerant-fpgas\/\" target=\"_blank\" rel=\"noopener\">Microsemi<\/a><\/span>&#8216;s Mi-V, RISC-V-based soft central processing units (CPUs) and the solution&#8217;s integration with Microsemi&#8217;s SoftConsole software development environment, enabling a vastly improved, test-driven software development methodology for all Mi-V users.<br \/>\n<script async src=\"\/\/pagead2.googlesyndication.com\/pagead\/js\/adsbygoogle.js\"><\/script><br \/>\n<ins class=\"adsbygoogle\" style=\"display: block; text-align: center;\" data-ad-layout=\"in-article\" data-ad-format=\"fluid\" data-ad-client=\"ca-pub-7565662001938327\" data-ad-slot=\"7585079586\"><\/ins><br \/>\n<script>\n     (adsbygoogle = window.adsbygoogle || []).push({});\n<\/script><br \/>\nAs part of their collaboration within the Mi-V ecosystem, Antmicro and <span class=\"highlight highlight-blue\"><a href=\"https:\/\/engineernewsnetwork.com\/blog\/cesium-clocks-microsemi-portfolio-compliant-with-new-itu-standards-for-enhanced-primary-reference-clock\/\" target=\"_blank\" rel=\"noopener\">Microsemi<\/a><\/span> developed and tested software for Mi-V RISC-V processor subsystems.<\/p>\n<p>These were specially designed for Microsemi&#8217;s lowest power, cost-optimised mid-range PolarFire field programmable gate arrays (FPGAs), which are binary compatible to hardware, even before hardware is available.<\/p>\n<figure id=\"attachment_6585\" aria-describedby=\"caption-attachment-6585\" style=\"width: 618px\" class=\"wp-caption alignnone\"><a href=\"https:\/\/engineernewsnetwork.com\/blog\/wp-content\/uploads\/2018\/04\/renode.png\"><img loading=\"lazy\" decoding=\"async\" class=\"size-large wp-image-6585\" src=\"https:\/\/engineernewsnetwork.com\/blog\/wp-content\/uploads\/2018\/04\/renode-728x1024.png\" alt=\"Improving test-driven software development methodology\" width=\"618\" height=\"869\" srcset=\"https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2018\/04\/renode-728x1024.png 728w, https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2018\/04\/renode-213x300.png 213w, https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2018\/04\/renode-768x1080.png 768w, https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2018\/04\/renode-800x1125.png 800w, https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2018\/04\/renode.png 1570w\" sizes=\"auto, (max-width: 618px) 100vw, 618px\" \/><\/a><figcaption id=\"caption-attachment-6585\" class=\"wp-caption-text\">Companies leverage strategic relationship to enable vastly improved test-driven software development methodology for all Mi-V users<\/figcaption><\/figure>\n<p>In addition to expanding <span class=\"highlight highlight-blue\">Microsemi<\/span>&#8216;s Mi-V ecosystem, as well as the adoption of its PolarFire FPGAs, the collaboration improves the development experience and quality of Mi-V-based systems.<\/p>\n<p>&#8220;Antmicro and its innovative Renode platform are excellent additions to Microsemi&#8217;s Mi-V ecosystem and help us enhance our RISC-V design offerings for customers,&#8221; said Venki Narayanan, senior director of system architecture and embedded solutions at Microsemi. &#8220;The Renode system brings rapid development and debug capabilities to our customers developing soft processors on our award-winning PolarFire FPGA. We look forward to further collaborations with the team at Antmicro, as well as the continued expansion of our ecosystem&#8217;s overall portfolio of solutions.&#8221;<\/p>\n<p>Customers can design and debug a complete processor subsystem within Antmicro&#8217;s virtual <span class=\"highlight highlight-blue\"><a href=\"https:\/\/github.com\/renode\/renode\" target=\"_blank\" rel=\"noopener\">Renode<\/a><\/span> environment on their desktop without actually needing target hardware.<\/p>\n<p>The resultant output is binary compatible to the processor running in the PolarFire FPGA.<\/p>\n<p>Antmicro&#8217;s Renode technology makes it ideal for a variety of RISC-V-based applications within the aerospace and defence, security, communications, industrial, medical and internet of things (IoT) markets, including secure communications, flight controls, machine vision, image processing, wireless communications, building automation and factory automation.<\/p>\n<p>&#8220;Renode has been designed to revolutionize the way we develop sophisticated embedded systems,&#8221; said Michael Gielda, business development manager at Antmicro. &#8220;A business-friendly open source project coming from a software-driven embedded design house, Renode is the perfect match for both the Mi-V ecosystem, and the RISC-V technology in general. We are proud to be bringing advanced development tools for Microsemi&#8217;s Mi-V to the wider developer community.&#8221;<\/p>\n<p>As part of Microsemi&#8217;s Mi-V RISC-V ecosystem, Antmicro&#8217;s Renode platform offers multiple connected virtual devices (multi-node) setups within the same simulated environment, bypassing the limitations associated with single device solutions like those from competitors.<\/p>\n<p>Using C#, a high productivity programming platform, and advanced abstraction layers, the solution boasts ease-of-development for customers without the hassle of C programming.<\/p>\n<p>In addition, it offers full visibility of the simulated platform enabling better insight and increased security, and is open source to allow for unlimited integrations, modifications and additions, as well as easy bundling and distribution to customers -particularly those leveraging Microsemi&#8217;s SoftConsole.<\/p>\n<p><strong>Additional features<\/strong><\/p>\n<p>* Business-friendly MIT license (also known as the X11 license or MIT X license) with commercial support provided by Antmicro<\/p>\n<p>* Teamwork supporting features, such as state saving and event recording<\/p>\n<p>* Automatic testing frameworks and continuous integration<\/p>\n<p>* Extensive application program interfaces (APIs), allowing easy integration with external tools<\/p>\n<p>* Rapid prototyping of complex setups, including multi-node use case, enabling multi-node debugging<\/p>\n<p>* Software-agnostic, run binary-compatible firmware like those on hardware, but with additional features<\/p>\n<p>* Easy model development with high-level programming environment<\/p>\n<p>* Well-structured API, plugins and extensions model for easy integration<\/p>\n<p>* Runtime reconfiguration and layers structure, ensuring sensitive information is isolated<\/p>\n<p>* Continuous integration and improved development workflows<\/p>\n<p>* Ease of implementation of test cases, allowing for greater test coverage.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Microsemi\u00a0announces Antmicro, an international research and development company known for its work with emerging technologies in embedded and cyber-physical systems, has joined Microsemi&#8217;s Mi-V(TM) RISC-V ecosystem. As the maker of the open source Renode framework for multi-node simulation, Antmicro has implemented support for Microsemi&#8216;s Mi-V, RISC-V-based soft central processing units (CPUs) and the solution&#8217;s integration &hellip;<\/p>\n","protected":false},"author":1,"featured_media":6584,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[104],"tags":[414,3668,1804,586,599,351,3672,3673,542,192,193,2179,3670,545,3669,597,2567,3671,709,3674],"class_list":["post-6582","post","type-post","status-publish","format-standard","has-post-thumbnail","","category-electronics","tag-aerospace","tag-antmicro","tag-building-automation","tag-communications","tag-defence","tag-factory-automation","tag-flight-controls","tag-image-processing","tag-industrial","tag-internet-of-things","tag-iot","tag-machine-vision","tag-markets","tag-medical","tag-mi-vtm-risc-v-ecosystem","tag-microsemi","tag-polarfire","tag-secure-communications","tag-security","tag-wireless-communications"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.4 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Improving test-driven software development methodology - Engineer News Network<\/title>\n<meta name=\"description\" content=\"Microsemi&#039;s Mi-V Ecosystem continues to expand as new member Antmicro joins to develop Mi-V RISC-V processor subsystems for PolarFire FPGAs\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.engineernewsnetwork.com\/blog\/improving-test-driven-software-development-methodology\/\" \/>\n<meta property=\"og:locale\" content=\"en_GB\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Improving test-driven software development methodology - Engineer News Network\" \/>\n<meta property=\"og:description\" content=\"Microsemi&#039;s Mi-V Ecosystem continues to expand as new member Antmicro joins to develop Mi-V RISC-V processor subsystems for PolarFire FPGAs\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.engineernewsnetwork.com\/blog\/improving-test-driven-software-development-methodology\/\" \/>\n<meta property=\"og:site_name\" content=\"Engineer News Network\" \/>\n<meta property=\"article:published_time\" content=\"2018-04-18T06:30:35+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2018\/04\/renode-ci.png\" \/>\n\t<meta property=\"og:image:width\" content=\"1920\" \/>\n\t<meta property=\"og:image:height\" content=\"1080\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/png\" \/>\n<meta name=\"author\" content=\"admin\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"admin\" \/>\n\t<meta name=\"twitter:label2\" content=\"Estimated reading time\" \/>\n\t<meta name=\"twitter:data2\" content=\"3 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/improving-test-driven-software-development-methodology\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/improving-test-driven-software-development-methodology\\\/\"},\"author\":{\"name\":\"admin\",\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/#\\\/schema\\\/person\\\/4477342aea8e299c6a21761e513ea8e1\"},\"headline\":\"Improving test-driven software development methodology\",\"datePublished\":\"2018-04-18T06:30:35+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/improving-test-driven-software-development-methodology\\\/\"},\"wordCount\":666,\"image\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/improving-test-driven-software-development-methodology\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/wp-content\\\/uploads\\\/2018\\\/04\\\/renode-ci.png\",\"keywords\":[\"aerospace\",\"Antmicro\",\"Building Automation\",\"communications\",\"defence\",\"Factory Automation\",\"flight controls\",\"image processing\",\"industrial\",\"Internet of Things\",\"IoT\",\"machine vision\",\"markets\",\"medical\",\"Mi-V(TM) RISC-V ecosystem\",\"Microsemi\",\"PolarFire\",\"secure communications\",\"security\",\"wireless communications\"],\"articleSection\":[\"Electronics\"],\"inLanguage\":\"en-GB\"},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/improving-test-driven-software-development-methodology\\\/\",\"url\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/improving-test-driven-software-development-methodology\\\/\",\"name\":\"Improving test-driven software development methodology - Engineer News Network\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/improving-test-driven-software-development-methodology\\\/#primaryimage\"},\"image\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/improving-test-driven-software-development-methodology\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/wp-content\\\/uploads\\\/2018\\\/04\\\/renode-ci.png\",\"datePublished\":\"2018-04-18T06:30:35+00:00\",\"author\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/#\\\/schema\\\/person\\\/4477342aea8e299c6a21761e513ea8e1\"},\"description\":\"Microsemi's Mi-V Ecosystem continues to expand as new member Antmicro joins to develop Mi-V RISC-V processor subsystems for PolarFire FPGAs\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/improving-test-driven-software-development-methodology\\\/#breadcrumb\"},\"inLanguage\":\"en-GB\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/improving-test-driven-software-development-methodology\\\/\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"en-GB\",\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/improving-test-driven-software-development-methodology\\\/#primaryimage\",\"url\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/wp-content\\\/uploads\\\/2018\\\/04\\\/renode-ci.png\",\"contentUrl\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/wp-content\\\/uploads\\\/2018\\\/04\\\/renode-ci.png\",\"width\":1920,\"height\":1080,\"caption\":\"Microsemi's Mi-V Ecosystem continues to expand as new member Antmicro joins to develop Mi-V RISC-V processor subsystems for PolarFire FPGAs\"},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/improving-test-driven-software-development-methodology\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Improving test-driven software development methodology\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/#website\",\"url\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/\",\"name\":\"Engineer News Network\",\"description\":\"The ultimate online news and information resource for today's engineer\",\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-GB\"},{\"@type\":\"Person\",\"@id\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/#\\\/schema\\\/person\\\/4477342aea8e299c6a21761e513ea8e1\",\"name\":\"admin\",\"url\":\"https:\\\/\\\/www.engineernewsnetwork.com\\\/blog\\\/author\\\/admin\\\/\"}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"Improving test-driven software development methodology - Engineer News Network","description":"Microsemi's Mi-V Ecosystem continues to expand as new member Antmicro joins to develop Mi-V RISC-V processor subsystems for PolarFire FPGAs","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.engineernewsnetwork.com\/blog\/improving-test-driven-software-development-methodology\/","og_locale":"en_GB","og_type":"article","og_title":"Improving test-driven software development methodology - Engineer News Network","og_description":"Microsemi's Mi-V Ecosystem continues to expand as new member Antmicro joins to develop Mi-V RISC-V processor subsystems for PolarFire FPGAs","og_url":"https:\/\/www.engineernewsnetwork.com\/blog\/improving-test-driven-software-development-methodology\/","og_site_name":"Engineer News Network","article_published_time":"2018-04-18T06:30:35+00:00","og_image":[{"width":1920,"height":1080,"url":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2018\/04\/renode-ci.png","type":"image\/png"}],"author":"admin","twitter_card":"summary_large_image","twitter_misc":{"Written by":"admin","Estimated reading time":"3 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/improving-test-driven-software-development-methodology\/#article","isPartOf":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/improving-test-driven-software-development-methodology\/"},"author":{"name":"admin","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/#\/schema\/person\/4477342aea8e299c6a21761e513ea8e1"},"headline":"Improving test-driven software development methodology","datePublished":"2018-04-18T06:30:35+00:00","mainEntityOfPage":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/improving-test-driven-software-development-methodology\/"},"wordCount":666,"image":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/improving-test-driven-software-development-methodology\/#primaryimage"},"thumbnailUrl":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2018\/04\/renode-ci.png","keywords":["aerospace","Antmicro","Building Automation","communications","defence","Factory Automation","flight controls","image processing","industrial","Internet of Things","IoT","machine vision","markets","medical","Mi-V(TM) RISC-V ecosystem","Microsemi","PolarFire","secure communications","security","wireless communications"],"articleSection":["Electronics"],"inLanguage":"en-GB"},{"@type":"WebPage","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/improving-test-driven-software-development-methodology\/","url":"https:\/\/www.engineernewsnetwork.com\/blog\/improving-test-driven-software-development-methodology\/","name":"Improving test-driven software development methodology - Engineer News Network","isPartOf":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/#website"},"primaryImageOfPage":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/improving-test-driven-software-development-methodology\/#primaryimage"},"image":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/improving-test-driven-software-development-methodology\/#primaryimage"},"thumbnailUrl":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2018\/04\/renode-ci.png","datePublished":"2018-04-18T06:30:35+00:00","author":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/#\/schema\/person\/4477342aea8e299c6a21761e513ea8e1"},"description":"Microsemi's Mi-V Ecosystem continues to expand as new member Antmicro joins to develop Mi-V RISC-V processor subsystems for PolarFire FPGAs","breadcrumb":{"@id":"https:\/\/www.engineernewsnetwork.com\/blog\/improving-test-driven-software-development-methodology\/#breadcrumb"},"inLanguage":"en-GB","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.engineernewsnetwork.com\/blog\/improving-test-driven-software-development-methodology\/"]}]},{"@type":"ImageObject","inLanguage":"en-GB","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/improving-test-driven-software-development-methodology\/#primaryimage","url":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2018\/04\/renode-ci.png","contentUrl":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2018\/04\/renode-ci.png","width":1920,"height":1080,"caption":"Microsemi's Mi-V Ecosystem continues to expand as new member Antmicro joins to develop Mi-V RISC-V processor subsystems for PolarFire FPGAs"},{"@type":"BreadcrumbList","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/improving-test-driven-software-development-methodology\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/www.engineernewsnetwork.com\/blog\/"},{"@type":"ListItem","position":2,"name":"Improving test-driven software development methodology"}]},{"@type":"WebSite","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/#website","url":"https:\/\/www.engineernewsnetwork.com\/blog\/","name":"Engineer News Network","description":"The ultimate online news and information resource for today's engineer","potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.engineernewsnetwork.com\/blog\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-GB"},{"@type":"Person","@id":"https:\/\/www.engineernewsnetwork.com\/blog\/#\/schema\/person\/4477342aea8e299c6a21761e513ea8e1","name":"admin","url":"https:\/\/www.engineernewsnetwork.com\/blog\/author\/admin\/"}]}},"_links":{"self":[{"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/posts\/6582","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/comments?post=6582"}],"version-history":[{"count":1,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/posts\/6582\/revisions"}],"predecessor-version":[{"id":6586,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/posts\/6582\/revisions\/6586"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/media\/6584"}],"wp:attachment":[{"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/media?parent=6582"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/categories?post=6582"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.engineernewsnetwork.com\/blog\/wp-json\/wp\/v2\/tags?post=6582"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}