{"id":7095,"date":"2018-05-08T11:18:43","date_gmt":"2018-05-08T10:18:43","guid":{"rendered":"https:\/\/engineernewsnetwork.com\/blog\/?p=7095"},"modified":"2018-05-08T11:18:43","modified_gmt":"2018-05-08T10:18:43","slug":"ageing-analysis-enables-accurate-prediction-of-product-wear-out","status":"publish","type":"post","link":"https:\/\/www.engineernewsnetwork.com\/blog\/ageing-analysis-enables-accurate-prediction-of-product-wear-out\/","title":{"rendered":"Ageing analysis enables accurate prediction of product wear-out"},"content":{"rendered":"<span class=\"highlight highlight-blue\"><a href=\"https:\/\/engineernewsnetwork.com\/blog\/cadence-shortens-automotive-verification-closure-with-new-verification-ip-for-ufs-3-0-coaxpress-and-hyperram\/\" target=\"_blank\" rel=\"noopener\">Cadence Design Systems<\/a><\/span>\u2019 debuts first analogue IC design-for-reliability solution addresses reliability challenges across the product lifecycle for automotive, medical, industrial, aerospace and defence applications.<\/p>\n<p>Cadence Design Systems\u2019 Cadence <span class=\"highlight highlight-blue\"><a href=\"http:\/\/www.cadence.com\/go\/legatoreliability\" target=\"_blank\" rel=\"noopener\">Legato Reliability Solution<\/a><\/span> is the industry\u2019s first software product that meets the challenges of designing high-reliability analogue and mixed-signal integrated circuits (ICs) for automotive, medical, industrial, and aerospace and defence applications.<\/p>\n<figure id=\"attachment_7097\" aria-describedby=\"caption-attachment-7097\" style=\"width: 618px\" class=\"wp-caption alignnone\"><a href=\"https:\/\/engineernewsnetwork.com\/blog\/wp-content\/uploads\/2018\/05\/CA348-HeatmapPowerMOS.jpg\"><img loading=\"lazy\" decoding=\"async\" class=\"size-large wp-image-7097\" src=\"https:\/\/engineernewsnetwork.com\/blog\/wp-content\/uploads\/2018\/05\/CA348-HeatmapPowerMOS-791x1024.jpg\" alt=\"Ageing analysis enables accurate prediction of product wear-out\" width=\"618\" height=\"800\" srcset=\"https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2018\/05\/CA348-HeatmapPowerMOS-791x1024.jpg 791w, https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2018\/05\/CA348-HeatmapPowerMOS-232x300.jpg 232w, https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2018\/05\/CA348-HeatmapPowerMOS-768x994.jpg 768w, https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2018\/05\/CA348-HeatmapPowerMOS-800x1035.jpg 800w, https:\/\/www.engineernewsnetwork.com\/blog\/wp-content\/uploads\/2018\/05\/CA348-HeatmapPowerMOS.jpg 1275w\" sizes=\"auto, (max-width: 618px) 100vw, 618px\" \/><\/a><figcaption id=\"caption-attachment-7097\" class=\"wp-caption-text\">The Cadence Legato Reliability Solution simulates on-chip temperature rise and operation to prevent thermal overstress<\/figcaption><\/figure>\n<p>The Legato Reliability Solution provides analogue designers with the tools they need to manage their design\u2019s reliability throughout the product lifecycle, from initial test through active life through ageing.<br \/>\n<script async src=\"\/\/pagead2.googlesyndication.com\/pagead\/js\/adsbygoogle.js\"><\/script><br \/>\n<ins class=\"adsbygoogle\" style=\"display: block; text-align: center;\" data-ad-layout=\"in-article\" data-ad-format=\"fluid\" data-ad-client=\"ca-pub-7565662001938327\" data-ad-slot=\"7585079586\"><\/ins><br \/>\n<script>\n     (adsbygoogle = window.adsbygoogle || []).push({});\n<\/script><br \/>\nBased on the Cadence Spectre Accelerated Parallel Simulator and the Cadence Virtuoso custom IC design platform, the Legato Reliability Solution integrates capabilities into an intuitive cockpit to address the reliability concerns of the three phases of the product lifecycle:<\/p>\n<p>* Analogue defect analysis accelerates analog defect simulation by up to 100X, reducing test cost and eliminating test escapes, the main source of early failure in IC designs<\/p>\n<p>* Electro-thermal analysis avoids premature failures due to thermal overstress during the product\u2019s useful life<\/p>\n<p>* Advanced ageing analysis enables accurate prediction of product wear-out by analysing ageing acceleration due to temperature and process variation.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Cadence Design Systems\u2019 debuts first analogue IC design-for-reliability solution addresses reliability challenges across the product lifecycle for automotive, medical, industrial, aerospace and defence applications. Cadence Design Systems\u2019 Cadence Legato Reliability Solution is the industry\u2019s first software product that meets the challenges of designing high-reliability analogue and mixed-signal integrated circuits (ICs) for automotive, medical, industrial, and &hellip;<\/p>\n","protected":false},"author":1,"featured_media":7096,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[104],"tags":[4038,121,1117,542,545],"class_list":["post-7095","post","type-post","status-publish","format-standard","has-post-thumbnail","","category-electronics","tag-aerospace-and-defence","tag-automotive","tag-cadence-design-systems","tag-industrial","tag-medical"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.4 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Ageing analysis enables accurate prediction of product wear-out - Engineer News Network<\/title>\n<meta name=\"description\" content=\"Advanced ageing analysis enables accurate prediction of product wear-out by analysing ageing acceleration due to temperature and process variation\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.engineernewsnetwork.com\/blog\/ageing-analysis-enables-accurate-prediction-of-product-wear-out\/\" \/>\n<meta property=\"og:locale\" content=\"en_GB\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Ageing analysis enables accurate prediction of product wear-out - 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