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Materials characterisation: software for microscopy data visualisation and analysis

Atomic force microscopy topography combined with aluminium (green), oxygen (red) and titanium (blue) EDS maps using Relate software

Oxford Instruments and Digital Surf, creator of the industry-standard Mountains surface and image analysis software platform, announce the release of Relate software for users of Oxford Instruments’ leading-edge tools for materials characterisation.

This software will bring great value to Oxford Instruments’ users working in R&D across a wide range of academic and industrial applications including semiconductors, renewable energy, mining, metallurgy, and forensics.

Relate software lets users get more out of their data by supplying accurate, innovative tools for visualising, analysing and reporting, in particular:

Correlation of spectrometry (EDS and EBSD) data with atomic force microscopy data and microscopy images with easy-to-use tools for rapid manual and semi-automated correlation of multiple images.

3D and 2D visualisation of composite data sets showing EDS, EBSD and EM image layers combined with topography and material properties as measured by AFM, helping to reveal the micro- and nano-characteristics of a sample.

Analysis of correlated quantitative data by extracting underlying data values in addition to qualitative images (eg, x-ray counts for each element).

Easy report generation: data and images can be organised and published in popular formats (PDF, Word, etc).

Documented, interactive workflow allowing maximum flexibility and traceability during the image analysis process.

“Relate software is a highly accurate tool for correlative analysis for researchers utilising several different instrument technologies (EM, AFM and spectrometry). Using one single software program to combine different datasets helps ensure the efficiency of analysis routines and the generation of meaningful results,” said Louise Hughes, Product manager for Life Sciences, NanoAnalysis. 

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