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Advanced PMD time-of-flight technology delivers millimetre precision and expanded ranges up to four metres for diverse industrial applications

New generation of OGD distance sensors 

ifm has announced the immediate availability of its new generation of OGD distance sensors, bringing enhanced performance and reliability to industrial automation. These innovative sensors utilise advanced Photonic Mixer Device (PMD) time-of-flight technology to deliver distance measurement with millimetre precision. Designed to meet the rigorous demands of modern manufacturing, the updated OGD series offers dependable solutions, from short-distance process verification to long-distance object detection.

The latest OGD lineup provides unprecedented performance across a significantly wider operational range. The OGD560 model, operating as a laser class 2 device, doubles the previous maximum range to enable reliable error-proofing at distances of up to four metres. For tasks requiring close-proximity precision, models like the OGD540 ensure total process reliability.

A major advancement in this sensor generation is the introduction of the Ultimate Black Mode. This capability allows the sensors to reliably detect challenging items, including highly reflective materials and jet-black products that typically disrupt optical measurement systems. This innovative feature makes the new OGD sensors highly versatile problem solvers across various demanding sectors, including robotics, handling technology, assembly automation, and logistics.

To accommodate specific environmental requirements, ifm now offers the OGD series in a choice of robust plastic or heavy-duty stainless steel housings. The devices prioritise ease of use, featuring a highly visible two-colour display that signals the current measurement status through a clear red-green colour change. Operators can configure the sensors directly via the device buttons or conveniently from a distance using IO-Link integration. This connectivity also facilitates the simultaneous output of both distance and reflectance values for comprehensive process evaluation.

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