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The radar target simulator R&S RTS, from Rohde & Schwarz, has been used to verify the performance of NXP Semiconductors’ …
Read More »Verifing automotive radar sensor reference design for extremely short object distances
Front-end enables software-defined factory
NXP Semiconductors announces its new NXP analogue front-end (N-AFE) family for high-precision data acquisition and condition monitoring systems for factory …
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