Home / Electronics / Reducing spike voltages generated during switching

Reducing spike voltages generated during switching

New additions have improved reverse recovery characteristics that a critical for synchronous rectification applications

Toshiba adds two new 150V N-channel power MOSFET products based upon their latest generation U-MOS X-H Trench process. The TPH1100CQ5 and TPH1400CQ5 devices are designed specifically for use in high-performance switching power supplies, such as those used in data centres and communication base stations as well as other industrial applications.

With a maximum drain-source voltage (VDSS) rating of 150V and drain current (ID) handling 49A (TPH1100CQ5) and 32A (TPH1400CQ5), the new devices feature a maximum drain-source on-resistance (RDS(ON)) of 11mΩ and 14mΩ, respectively.

The new products offer improved reverse recovery characteristics that are critical in synchronous rectification applications. In the case of TPH1400CQ5, the reverse recovery charge (Qrr) is reduced by approximately 73% to 27nC (typ.) and the reverse recovery time (trr) of 36 ns (typ.) is approximately 45% faster compared with Toshiba’s existing TPH1400CQH, which offers the same voltage and RDS(ON). Used in synchronous rectification applications, the TPH1400CQ5 reduces the power loss of switching power supplies and helps improve efficiency. If the device is used in a circuit that does not operate in reverse recovery mode, the power loss is equivalent to that of the TPH1400CQH.

When used in a circuit that operates in reverse recovery mode, the new products reduce spike voltages generated during switching, helping to improve EMI characteristics of designs, and reducing the need for external filtering. The devices are housed in a versatile, surface-mount SOP Advance(N) package measuring just 4.9mm x 6.1mm x 1.0mm.

Check Also

Low-voltage single-gate logic device lineup expanded with 21 new XSON6 packaged products

ToshibaToshiba expands its 7UL series of low-voltage, single-gate logic ICs with the introduction of 21 new devices …

How ASIC applications impact material considerations

Ross Turnbull explores how material choices affect ASIC performance, reliability and longevity across automotive, industrial …

Event camera in use in production processes for fault analysis and a real-time view into the machine

The VOC event camera enables event-driven recordings with up to 900s before and after the …