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Siko’s AP05 position indicator is now available with an integrated IO-Link interface. As the core element of monitored size changeover, …
Read More »Sensors will define the future of production and technology
This past year it has been difficult to open an engineering magazine and not read about the Internet of Things …
Read More »On-wafer device characterisation test solution
Rohde & Schwarz now offers a test solution for full RF performance characterisation of the DUT on-wafer which combines the …
Read More »Connectors deliver greater board-to-board spacing
To support the complete breadth of customer applications, Harwin adds another option to its Datamate series of high-reliability (Hi-Rel) connectors. …
Read More »Micro-ATX motherboards designed for continuous operation
Display solutions and embedded systems provider, Review Display Systems (RDS) has announced the introduction of a new family of industrial …
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